4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Stefan Wallstab

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Chip card circuit with monitored access to a test mode

Electronic digital logic circuitry – Security
Reexamination Certificate

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Circuit configuration with deactivatable scan path

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Data processing device

Electrical computers and digital processing systems: support – Data processing protection using cryptography – Tamper resistant
Reexamination Certificate

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Integrated security circuit

Electrical computers and digital processing systems: support – Data processing protection using cryptography
Reexamination Certificate

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Semiconductor device and production process

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2618923

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