4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Srivatsan Seshadri

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CD-GISAXS system and method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Structured anode X-ray source for X-ray microscopy

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2336287

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