4. Data processing: structural design, modeling, simulation, and em
  5. Simulating electronic device or electrical system
  6. Circuit simulation

Sophie H. M. Gabillet

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Capacitance measurements for an integrated circuit

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Capacitance measurements for an integrated circuit

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2891826

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