Capacitance measurements for an integrated circuit

Details Capacitance measurements for an integrated circuit Capacitance measurements for an integrated circuit

2005-08-23

2005-08-23

Phan, Thai (Department: 2128)

Data processing: structural design, modeling, simulation, and em

Simulating electronic device or electrical system

Circuit simulation

C703S002000, C324S663000, C324S676000, C324S765010, C324S658000

Reexamination Certificate

active

06934669

ABSTRACT:
A method and apparatus for determining capacitance of wires in an integrated circuit is described. The capacitance information derived according to the invention can be used, for example, to calibrate a parasitic extraction engine or to calibrate an integrated circuit fabrication process. The capacitance information can also be used for timing and noise circuit simulations, particularly for deep sub-Micron circuit design simulations. Briefly, the invention allows measurement of both total capacitance of a line and cross coupling capacitance between two lines by applying predetermined voltage signals to specific circuit elements. The resulting current allows simple computation of total capacitance and cross coupling capacitance. Multiple cross coupling capacitance can be measured with a single device, thus improving the art of library generation, and the overall method is free of uncertainties related to transistor capacitance couplings. The capacitance values obtained can then be used to calibrate procedures, processes, devices, etc.

REFERENCES:
patent: 5212454 (1993-05-01), Proebsting
patent: 5901063 (1999-05-01), Chang et al.
patent: 5999010 (1999-12-01), Arora et al.
patent: 6011731 (2000-01-01), Beigel et al.
patent: 6249903 (2001-06-01), McSherry et al.
patent: 6300765 (2001-10-01), Chen
patent: 6414498 (2002-07-01), Chen
Chen et al, “An On-Chip, Attofarad Interconnect Charge-based Capacitance Measurement Technique”, IEEE, 1996, pp. 3.4.1-3.4.4.
Sylvester et al, “Investigation of Interconnect Capacitance Characterization using Charge-based Capacitance Measurement Technique and 3-D Simulation”, IEEE, 1997, pp. 491-494.

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