4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Soon-keun Jeon

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Memory test circuit and test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Method and apparatus for testing semiconductor memory device...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2050765

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