4. Radiant energy
  5. Irradiation of objects or material
  6. Irradiation of semiconductor devices

Sik On Kong

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Constant current programming waveforms for non-volatile memories

Static information storage and retrieval – Floating gate – Particular biasing
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Method and apparatus for identifying high metal content on a...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate

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Method and apparatus for identifying high metal content on a...

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Reexamination Certificate

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Method and apparatus for identifying high metal content on a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Methods to reduce light leakage in LCD-on-silicon devices

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Including integrally formed optical element
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Profile ID: LFUS-PAI-P-737231

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