4. Radiant energy
  5. Inspection of solids or liquids by charged particles

Shuzo Mishima

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Atomic force microscope

Optical: systems and elements – Compound lens system – Microscope
Patent

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Atomic probe microscope and cantilever unit for use in the micro

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Microscope system

Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate

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Probe for a scanning tunneling microscope

Photography and optical equipment – Optical article not elsewhere specified – Lens or objective
Patent

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Probe unit for an atomic probe microscope

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Profile ID: LFUS-PAI-P-231456

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