4. Electrical transmission or interconnection systems
  5. Nonlinear reactor systems
  6. Parametrons

Shintaro Mori

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IC test system and storage medium for the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Microcomputer equipped with built-in temperature sensor

Electricity: electrical systems and devices – Safety and protection of systems and devices – Circuit interruption by thermal sensing
Reexamination Certificate

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Semiconductor integrated circuit device

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – For plural devices
Reexamination Certificate

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Squelch detecting circuit

Telecommunications – Receiver or analog modulated signal frequency converter – Squelch
Reexamination Certificate

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Switching output circuit with high speed operation and low power

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent

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Profile ID: LFUS-PAI-P-131677

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