4. Measuring, testing, or signalling instruments
  5. Measuring, regulating or indicating instrument, or casing
  6. Electrical property

Shinobu Otsuka

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Console for measurement scanner for semi-conductor

Measuring – testing – or signalling instruments – Measuring – regulating or indicating instrument – or casing – Electrical property
Patent

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Control system and method of semiconductor inspection system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Scanning electron microscope and method of processing the same

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Patent

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Profile ID: LFUS-PAI-P-946734

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