4. Semiconductor device manufacturing: process
  5. Chemical etching
  6. Vapor phase etching

Shih-Chieh Kao

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Method of determining integrity of a gate dielectric

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method of metal etching post cleaning

Etching a substrate: processes – Nongaseous phase etching of substrate – Etching inorganic substrate
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Method of preventing damages of gate oxides of a semiconductor w

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
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Structure of signal line

Electricity: conductors and insulators – Anti-inductive structures – Conductor transposition
Reexamination Certificate

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Structure of signal plug

Electrical connectors – Including or for use with coaxial cable
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Profile ID: LFUS-PAI-P-392407

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