4. Optics: measuring and testing
  5. By light interference
  6. Having polarization

Shigeru Serikawa

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Interference detecting system for use in interferometer

Optics: measuring and testing – By light interference – Having polarization
Reexamination Certificate

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Method and apparatus for detecting defects on a disk surface

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method and apparatus for measuring heterodyne optical...

Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate

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Method and device for detecting shape of surface of medium

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Profile ID: LFUS-PAI-P-2037562

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