4. Semiconductor device manufacturing: process
  5. Chemical etching
  6. Vapor phase etching

Scott Edward Beck

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Flow sensor apparatus and method with media isolated...

Measuring and testing – Specimen stress or strain – or testing by stress or strain...
Reexamination Certificate

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Gas phase removal of SiO.sub.2 /metals from silicon

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
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Halogen addition for improved adhesion of CVD copper to barrier

Stock material or miscellaneous articles – All metal or with adjacent metals – Composite; i.e. – plural – adjacent – spatially distinct metal...
Reexamination Certificate

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Halogen addition for improved adhesion of CVD copper to barrier

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Interdigitated, full wheatstone bridge flow sensor transducer

Measuring and testing – Volume or rate of flow – Thermal type
Reexamination Certificate

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Profile ID: LFUS-PAI-P-392344

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