4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Scott Derner

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6F2 architecture ROM embedded DRAM

Static information storage and retrieval – Read only systems
Reexamination Certificate

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DRAM with bias sensing

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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DRAM with bias sensing

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Embedded ROM device using substrate leakage

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Embedded ROM device using substrate leakage

Static information storage and retrieval – Systems using particular element – Capacitors
Reexamination Certificate

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Profile ID: LFUS-PAI-P-823489

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