4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Encapsulated
  6. With specified encapsulant

Sang-Jun Kim

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Apparatus and method for measurement of film thickness using...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Semiconductor package with pattern leads and method for...

Active solid-state devices (e.g. – transistors – solid-state diode – Encapsulated – With specified encapsulant
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2991579

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