4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Gate arrays
  6. With particular power supply distribution means

Sang-Deok Kwon

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Monitoring pattern for detecting a defect in a semiconductor...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Structure and method for failure analysis in a semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular power supply distribution means
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3164479

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