4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Sally Botala

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Testable programmable gate array and associated LSSD/determinist

Excavating
Patent

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Testable programmable gate array and associated LSSD/determinist

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-1119645

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