Excavating
Patent
1995-12-12
1999-02-02
DeCady, Albert
Excavating
39518306, G01R 3128
Patent
active
058675078
ABSTRACT:
A programmable gate array includes test subsystems for testing various functional subsystems of the programmable gate array. A sequence of test methods, employing the test subsystems, test the functionality of the programmable gate array, taking into account the interdependencies of the various subsystems and accordingly enabling fault isolation therein.
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Eichelberger, E. & Williams, T., "A Logic Design Structure for LSI Testability," The Proceedings of the 14th Design Automation Conference, 1977, pp. 206-211.
Beebe Wayne Kevin
Botala Sally
Gould Scott Whitney
Keyser III Frank Ray
Larsen Wendell Ray
De'cady Albert
International Business Machines - Corporation
Iqbal Nadeem
LandOfFree
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