4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Ryoji Yoshikawa

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Mask defect inspection data generating method, mask defect...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Reference data generating method, pattern defect checking...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3190075

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