4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Field effect device
  6. Having insulated electrode

Ronald J. Bolam

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Circuitry and methodology to establish correlation between...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuitry and methodology to establish correlation between...

Electricity: measuring and testing – Determining nonelectric properties by measuring electric...
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Method and structure for creation of a metal insulator metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Method for correcting for asymmetry of threshold voltage shifts

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Process of manufacturing silicon-on-insulator chip having an...

Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure
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Profile ID: LFUS-PAI-P-700892

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