4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Electrical characteristic sensed

Rolf Geilenkeuser

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Integrated semiconductor structure for reliability tests of...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Method for determining projected lifetime of semiconductor...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3015144

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