Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2006-02-08
2008-03-04
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
C702S118000, C324S762010
Reexamination Certificate
active
07340360
ABSTRACT:
A method for efficiently and accurately measuring a maximum Vcccalculation or failure rate and lifetime projection for microprocessors and other semiconductor products analytically scales low voltages applied to thinner oxides to thicker oxides. The expanded voltage window that is closer to the use voltage is obtained thereby to provide accurate voltage acceleration factors and max Vceextraction.
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Geilenkeuser Rolf
Marathe Amit
Taylor Kurt
Weidner Joerg-Oliver
Zhang John
Advanced Micro Devices , Inc.
Barlow John
McDermott & Will & Emery
Washburn Douglas N
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