4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Of specified material other than unalloyed aluminum

Robert W. Bollish

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Apparatus for performing wafer level testing of integrated circu

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With peripheral feature due to separation of smaller...
Patent

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Apparatus for performing wafer-level testing of integrated circu

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Patent

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Method and apparatus for performing wafer level testing of integ

Fishing – trapping – and vermin destroying
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Profile ID: LFUS-PAI-P-1219516

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