4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Robert M. Senger

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Calibration of multi-metric sensitive delay measurement...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
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Circuit for dynamic circuit timing synthesis and monitoring...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific signal discriminating without subsequent control – By shape
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Correction of delay-based metric measurements using delay...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Support for non-locking parallel reception of packets...

Electrical computers and digital data processing systems: input/ – Input/output data processing – Direct memory accessing
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Profile ID: LFUS-PAI-P-3188473

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