4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Integrated circuit structure with electrically isolated...
  6. Passive components in ics

Robert M. Gravelle

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Dynamic creation and modification of wafer test maps during...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Integrated circuit having isolated anti-fuse structures and...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate

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Isolated anti-fuse structure and method for fabricating same

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Patent

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Method for fabricating isolated anti-fuse structure

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1819159

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