4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Robert M. Glidden

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RFID tag design with circuitry for wafer level testing

Communications: electrical – Condition responsive indicating system – Specific condition
Reexamination Certificate

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RFID tag with bist circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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RFID tag with bist circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Wafer level testing for RFID tags

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2372378

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