4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Robert L. Wisnieff

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Array tester for determining contact quality and line integrity

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Display fabrication using modular active devices

Metal working – Method of mechanical manufacture – Utilizing transitory attached element or associated separate...
Reexamination Certificate

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Display fabrication using modular active devices

Electric lamp and discharge devices – With luminescent solid or liquid material – Solid-state type
Reexamination Certificate

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Driving method and circuit for pixel multiplexing circuits

Computer graphics processing and selective visual display system – Plural physical display element control system – Display elements arranged in matrix
Reexamination Certificate

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Integrated prism sheet for improved viewing angle in direct...

Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1198924

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