Array tester for determining contact quality and line integrity

Details Array tester for determining contact quality and line integrity Array tester for determining contact quality and line integrity

1993-03-05

1996-08-13

Nguyen, Vinh P.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

3241581, G06F 702

Patent

active

055460135

ABSTRACT:
An apparatus for testing for and classifying defects in a TFT/LCD array having gate lines and data lines. Devices are provided for activating cells of the array by applying gate pulses to the gate lines and pulses to the data lines. Devices are also provided for acquiring waveforms from data lines of the array. Additional devices sample the waveforms at selected points in time. A computer may be used to classify the waveforms to indicate whether defects are present and if present, the nature of the defects by comparing voltages of the waveform at the selected points in time.

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L. C. Jenkins et al., "Functional testing of TFT/LCD arrays"IBM Journal of Research and Development vol. 36, No. 1, Jan. 1992 pp. 59-68.

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