4. Geometrical instruments

Robert F. Cook

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Arresting material test apparatus and methods

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Patent

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Integrated circuit having crack stop for interlevel dielectric l

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects
Patent

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Mechanical strength die sorting

Classifying – separating – and assorting solids – Sorting special items – and certain methods and apparatus for... – Condition responsive means controls separating means
Reexamination Certificate

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Method and system for dicing wafers, and semiconductor...

Stone working – Sawing – Rotary
Reexamination Certificate

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Method and system for dicing wafers, and semiconductor...

Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-223524

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