4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Richard James Evans

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Image processing methods for the optical detection of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method for fabrication of silicon on insulator substrates

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Method for fabrication of silicon on insulator substrates

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
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Using time resolved light emission from VLSI circuit devices...

Image analysis – Applications – Manufacturing or product inspection
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Profile ID: LFUS-PAI-P-2043096

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