4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Non-single crystal, or recrystallized, semiconductor...
  6. Non-single crystal, or recrystallized, active junction...

Rex W. Pirkle

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Low current blow trim fuse

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Non-single crystal – or recrystallized – active junction...
Reexamination Certificate

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Routing engine, method of routing a test probe and testing...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Selective trim and wafer testing of integrated circuits

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2588000

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