Routing engine, method of routing a test probe and testing...

Details Routing engine, method of routing a test probe and testing... Routing engine, method of routing a test probe and testing...

2007-11-07

2009-10-06

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C702S118000

Reexamination Certificate

active

07598759

ABSTRACT:
Embodiments of the present disclosure provide a routing engine, a method of routing a test probe and a testing system employing the router or the method. In one embodiment, the routing engine is for use with a test unit having at least one test probe and includes an analysis unit configured to analyze alternative test probe routing sequences that employ representative circuit chips of a semiconductor wafer to be tested by the test unit. The routing engine also includes a selection unit configured to select at least one of the test probe routing sequences as a test probe path for testing the semiconductor wafer based on a total cost of travel for the test probe path.

REFERENCES:
patent: 6872582 (2005-03-01), Pirkle et al.
patent: 7071721 (2006-07-01), Furukawa
patent: 7114135 (2006-09-01), Gauvin
patent: 7178078 (2007-02-01), Hiraide et al.

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