4. Electronic digital logic circuitry
  5. With test facilitating feature

Ray Abrishami

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Short pulse width noise immunity discriminator circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent

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Switchable pull-ups and pull-downs for IDDQ testing of integrate

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Switchable pull-ups and pull-downs for IDDQ testing of integrate

Electronic digital logic circuitry – With test facilitating feature
Patent

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Profile ID: LFUS-PAI-P-828137

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