4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Optimization

Qing Su

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Fast evaluation of average critical area for IC layouts

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
Reexamination Certificate

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Fast evaluation of average critical area for ic layouts

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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Fast evaluation of average critical area for IC layouts

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Fast evaluation of average critical area for IC layouts

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus to reduce random yield loss

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2196828

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