4. Material or article handling
  5. Apparatus for charging a load holding or supporting element...
  6. Load holding or supporting element including gripping means

Prometrix Corporation

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Apparatus and methods for resistivity testing

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Apparatus and methods for semiconductor wafer testing

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Apparatus for handling semiconductor wafers

Material or article handling – Apparatus for charging a load holding or supporting element... – Load holding or supporting element including gripping means
Patent

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Autofocusing system for microscope having contrast detection mea

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems
Patent

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Automatic semiconductor wafer tester

Measuring – testing – or signalling instruments – Measuring – regulating or indicating instrument – or casing – Electrical property
Patent

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Profile ID: LFUS-PAI-P-113190

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