4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Peter Pöchmüller

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Address counter for addressing synchronous high-frequency...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Circuit configuration for generating control signals for...

Electrical pulse counters – pulse dividers – or shift registers: c – Applications – Measuring or testing
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Circuit configuration for regulating the power consumption...

Electricity: power supply or regulation systems – Output level responsive – Using a three or more terminal semiconductive device as the...
Reexamination Certificate

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Circuit configuration for repairing a semiconductor memory

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Configuration and method for producing test signals for...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Profile ID: LFUS-PAI-P-2065826

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