4. Optics: measuring and testing
  5. By dispersed light spectroscopy
  6. Utilizing a spectrometer

Peter Ebbing

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Etch rate monitor using collimated light and method of using sam

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Magnetic semiconductor wafers with handling apparatus and method

Conveyors: power-driven – With means to facilitate working – treating – or inspecting... – Means engaging conveyor or load on a conveyor to align load...
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Method and apparatus for endpoint detection in a semiconductor w

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems
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Method and apparatus for endpoint detection in a semiconductor w

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems
Patent

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Method and apparatus for endpoint detection in a semiconductor w

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Profile ID: LFUS-PAI-P-397695

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