4. Coded data generation or conversion
  5. Converter calibration or testing

Pei-Wen Luo

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IC with built-in self-test and design method thereof

Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate

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Yield evaluating apparatus and method thereof

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Yield
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2848539

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