4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Paul K. Wheeler

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Automated method of burn-in and endurance testing for embedded E

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Method for optimizing test fixtures to minimize vector load...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Utility Patent

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Profile ID: LFUS-PAI-P-1354643

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