Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
Inventor
active
Area efficient, sequential gray code to thermometer code...
BIST circuit for variable impedance system
Method and apparatus for programmable active termination of...
Method and apparatus for testing dynamic logic using an...
On-chip automatic system for impedance matching in very high spe
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Profile ID: LFUS-PAI-P-477407