4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Patrick F. Leonard

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Method and apparatus for circuit pattern inspection

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Method and apparatus for determining angular pose of an object

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method and apparatus for determining angular pose of an object

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method and apparatus for evaluating integrated circuit...

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit
Reexamination Certificate

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Method and system for automatically visually inspecting an artic

Image analysis – Histogram processing – For setting a threshold
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Profile ID: LFUS-PAI-P-1865102

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