Method and apparatus for evaluating integrated circuit...

Details Method and apparatus for evaluating integrated circuit... Method and apparatus for evaluating integrated circuit...

2006-04-25

2006-04-25

Glick, Edward J. (Department: 2882)

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

C382S149000

Reexamination Certificate

active

07034272

ABSTRACT:
The present invention provides for methods and an apparatus for evaluating objects having three dimensional features. One method involves using both two dimensional data sets to improve the processing of three dimensional data sets. The two dimensional data set can be used to pre-qualify the three dimensional data set, or may be used to locate that data within the three dimensional data set that is characteristic of the three dimensional feature. The invention may include a sensor configured to capture both three dimensional and two dimensional data. The present invention provides for an efficient technique to evaluate three dimensional data. The present invention also solves heretofore unrecognized problems associated with geometric distortion.

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