Method and system for automatically visually inspecting an artic

Details Method and system for automatically visually inspecting an artic Method and system for automatically visually inspecting an artic

1989-05-19

1990-05-22

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 49, 358101, G06K 900

Patent

active

049283138

ABSTRACT:
A method and system are disclosed for automatically visually inspecting an article such as an electronic circuit wherein both reference and non-reference algorithms are utilized to detect circuit defects. The system includes a pipelined cellular image processor which is utilized to implement the non-reference algorithm and an arithmetic logic unit (ALU) is coupled to the output of the cellular image processor to perform the reference method. The non-reference method includes a spaces and traces algorithm and the reference method includes a topology matching algorithm. The system also includes an algorithm for locating and gauging critical areas of the circuit with sub-pixel accuracy. The cellular image processor is supported by a matched host image processor system

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