4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Noriyuki Aizawa

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Method and device for simultaneous measurement of...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Optical defect inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3264324

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