X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2005-11-24
2011-10-11
Midkiff, Anastasia (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S070000
Reexamination Certificate
active
08036338
ABSTRACT:
Since measurement of magnetostriction is accompanied by measurement of magnetization, magnetostriction and magnetization are measured conventionally by separately prepared devices, with efforts for observing the same region of the sample. Measurement of the magnetostriction is difficult due to the difficulty of compensation and calibration. The value of magnetostriction coefficient in low temperature region cannot be correctly determined. A convenient method which can measure magnetostriction and magnetization simultaneously at the same region of the sample and at the same time is developed by combining the method of measurement of magnetostriction by X-ray diffraction and the method of measurement of magnetic X-ray diffraction. The observed X-ray diffraction intensity as a function of the magnetic field from the sample can be separated to symmetric component and asymmetric component, which contain signals proportional to the magnetostriction and magnetization, respectively.
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Aizawa Noriyuki
Arakawa Etsuo
Maruyama Koichi
Midkiff Anastasia
National Institutes of Natural Sciences
Oliff & Berridg,e PLC
Tokyo Gakugei University
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