4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Electron microscope type

Norito Fujihara

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Apparatus and method for analyzing microscopic area

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent

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Semiconductor device, module for optical devices, and...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1211497

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