4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Nobutsugu Odani

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Electric device with flash memory built-in

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Non-volatile memory circuit

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Non-volatile semiconductor memory device and internal...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Semiconductor memory device

Static information storage and retrieval – Floating gate – Particular biasing
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Profile ID: LFUS-PAI-P-1741582

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