Arrangement with conductive pad embedment

Details Arrangement with conductive pad embedment Arrangement with conductive pad embedment

2007-12-11

2007-12-11

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

11089379

ABSTRACT:
A plurality of conductive pads of an apparatus in one example are disposed on a circuit board in a predetermined arrangement compatible with an arrangement of probes on an external test connector. One or more of the plurality of conductive pads is disposed on an embedded layer of the circuit board.

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