4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Incoherent light emitter structure
  6. With particular semiconductor material

Nicole Andrea Evers

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Current transformers for partial discharge detection on...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Detection of partial discharge or arcing in wiring via fiber...

Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate

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Homoepitaxial gallium nitride based photodetector and method...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate

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Homoepitaxial gallium nitride based photodetector and method...

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With particular semiconductor material
Reexamination Certificate

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Homoepitaxial gallium-nitride-based light emitting device...

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2739010

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