Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
Inventor
active
Anti-contamination diaphragm for an electron beam apparatus
Automatic beam correction in a scanning transmission electron mi
Microscope for non-differentiated phase image formation
No associations
LandOfFree
Nicolaas H. Dekkers does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Nicolaas H. Dekkers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nicolaas H. Dekkers will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-625225