4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Quality evaluation

Nickey Joe Atchison

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Bellows zoom microscope

Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Microscope with objective lens position control apparatus

Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Semiconductor process yield analysis based on evaluation of...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Temperature-controlled gas microscope

Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nickey Joe Atchison does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Nickey Joe Atchison, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nickey Joe Atchison will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2835061

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure